PHABRIX is expanding its range of hand held test and measurement instruments with the first showing of the PHABRIX SxE. Combining all the feature set developed for its successful PHABRIX SxA (AES) and PHABRIX SxD (Dual Link), the SxE offers a new ‘world’s first’ for a company fast becoming known for technological innovation – comprehensive 3G/HD/SD eye pattern rendering and jitter measurement to SMPTE standards. The company considers this to be the first full featured eye and jitter testing combination on a hand held platform.

The same intuitive interface of the SxA and the SxD models exists in the SxE with the new eye and jitter displays augmenting the existing toolset allowing the operator to quickly select between multiple ‘instruments’ at the touch of a button. The 4.3” TFT screen clearly presents eye and jitter diagrams with filter selection for timing and alignment measurements. Cursers and histogram functions allow detailed measurements to be made. These comprehensive features propel the SxE into the domain of much more expensive bench bound products.

The ability of the SxE to produce eye patterns from a 3G signal is particularly significant for those users requiring a solution to testing high end products in the 3G arena. Jitter too is one of the most important issues in the design and operation of high-speed serial links and the SxE’s jitter tools can be applied from SD-SDI, HD-SDI to 3G-SDI.

The PHABRIX SxE is still in development and a launch date is yet to be set however the addition of this high end functionality on a portable test generator, analyzer and monitor is sure to be a winner with engineers involved in a diverse range of broadcast situations from content creation and delivery through to R&D and manufacturing. The company has also announced that the PHABRIX SxA and PHABRIX SxD can be upgraded to the new SxE when available making investment in the shipped models even more attractive.

To see the new PHABRIX SxE visit Hall 8 Stand E05.